Paper
22 July 2008 Mapping electrical crosstalk in pixelated sensor arrays
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Abstract
Electronic coupling effects such as Inter-Pixel Capacitance (IPC) affect the quantitative interpretation of image data from CMOS, hybrid visible and infrared imagers alike. Existing methods of characterizing IPC do not provide a map of the spatial variation of IPC over all pixels. We demonstrate a deterministic method that provides a direct quantitative map of the crosstalk across an imager. The approach requires only the ability to reset single pixels to an arbitrary voltage, different from the rest of the imager. No illumination source is required. Mapping IPC independently for each pixel is also made practical by the greater S/N ratio achievable for an electrical stimulus than for an optical stimulus, which is subject to both Poisson statistics and diffusion effects of photo-generated charge. The data we present illustrates a more complex picture of IPC in Teledyne HgCdTe and HyViSi focal plane arrays than is presently understood, including the presence of a newly discovered, long range IPC in the HyViSi FPA that extends tens of pixels in distance, likely stemming from extended field effects in the fully depleted substrate. The sensitivity of the measurement approach has been shown to be good enough to distinguish spatial structure in IPC of the order of 0.1%.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Seshadri, D. M Cole, B. R. Hancock, and R. M. Smith "Mapping electrical crosstalk in pixelated sensor arrays", Proc. SPIE 7021, High Energy, Optical, and Infrared Detectors for Astronomy III, 702104 (22 July 2008); https://doi.org/10.1117/12.790150
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Staring arrays

Imaging systems

Sensors

Multiplexers

Capacitance

Infrared imaging

Point spread functions

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