Paper
18 July 2008 Noise performance of the Herschel-SPIRE bolometers during instrument ground tests
Bernhard Schulz, James J. Bock, Nanyao Lu, Hien T. Nguyen, C. Kevin Xu, Lijun Zhang, C. Darren Dowell, Matthew J. Griffin, Glenn T. Laurent, Tanya L. Lim, Bruce M. Swinyard
Author Affiliations +
Abstract
The flight model of the SPIRE instrument underwent several test campaigns in a test facility at the Rutherford Appleton Laboratory (RAL) in the UK. A final dark campaign, completed in March 2007, provided an environment virtually free from optical radiation. This allowed re-determining the fundamental model parameters of the NTD spider web bolometer detector arrays in the new environment. The tests reported in this paper produced a fairly homogeneous dataset to investigate white noise and 1/f noise at different bias voltages, bias frequencies, and bath temperatures. We find that the white noise performance is in excellent agreement with the model predictions, once we correct the low frequency signal variations that are due to temperature fluctuations of the thermal bath at about 300 mK. The temperature of the thermal bath (detector array base plate) is measured by thermistor pixels that are part of the bolometer arrays. A residual 1/f component beyond those variations is hardly detected. This unexpected stability is very welcome and will positively impact photometer scan maps, the most popular observing mode of SPIRE.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernhard Schulz, James J. Bock, Nanyao Lu, Hien T. Nguyen, C. Kevin Xu, Lijun Zhang, C. Darren Dowell, Matthew J. Griffin, Glenn T. Laurent, Tanya L. Lim, and Bruce M. Swinyard "Noise performance of the Herschel-SPIRE bolometers during instrument ground tests", Proc. SPIE 7020, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV, 702022 (18 July 2008); https://doi.org/10.1117/12.790163
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Cited by 6 scholarly publications.
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KEYWORDS
Bolometers

Photometry

Spectroscopy

Sensors

Field effect transistors

Temperature metrology

Data modeling

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