Paper
15 July 2008 Improving quantum efficiency and spectral resolution of a CCD through direct manipulation of the depletion region
Author Affiliations +
Abstract
Future generations of X-ray astronomy instruments will require position sensitive detectors in the form of charge-coupled devices (CCDs) for X-ray spectroscopy and imaging with the ability to probe the X-ray universe with greater efficiency. This will require the development of CCDs with structures that will improve their quantum efficiency over the current state of the art. The quantum efficiency improvements would have to span a broad energy range (0.2 keV to >15 keV). These devices will also have to be designed to withstand the harsh radiation environments associated with orbits that extend beyond the Earth's magnetosphere. This study outlines the most recent work carried out at the University of Leicester focused on improving the quantum efficiency of an X-ray sensitive CCD through direct manipulation of the device depletion region. It is also shown that increased spectral resolution is achieved using this method due to a decrease in the number of multi-pixel events. A Monte Carlo and analytical models of the CCD have been developed and used to determine the depletion depths achieved through variation of the device substrate voltage, Vss. The models are also used to investigate multi-pixel event distributions and quantum efficiency as a function of depletion depth.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Craig Brown, Richard M. Ambrosi, Tony Abbey, Olivier Godet, R. O'Brien, M. J. L. Turner, Andrew Holland, Peter J. Pool, David Burt, and David Vernon "Improving quantum efficiency and spectral resolution of a CCD through direct manipulation of the depletion region", Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 70113Z (15 July 2008); https://doi.org/10.1117/12.802622
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KEYWORDS
Charge-coupled devices

Quantum efficiency

Spectral resolution

X-rays

Silicon

Data modeling

Monte Carlo methods

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