Paper
22 April 2008 Correlation techniques in speckle metrology and digital holography
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Proceedings Volume 7008, Eighth International Conference on Correlation Optics; 70081E (2008) https://doi.org/10.1117/12.797343
Event: Eighth International Conference on Correlation Optics, 2007, Chernivsti, Ukraine
Abstract
Uses of correlation functions of speckle patterns and the complex amplitude reconstructed by digital holography in measurements of shape and deformation of rough surfaces are described. First, theoretical relationships for correlation properties of the scattered light are surveyed. They consist of speckle displacement and decorrelation. Speckle displacement is applied to measurement of strain by a laser-speckle strain gauge and a speckle extensometer. Speckle decorrelation is used for the measurements of surface roughness and monitoring of paint drying process. The cross-correlation coefficient of the complex amplitude, named here, the complex coherence factor can be calculated in digital holography and used for measurement of surface shape and deformation. It is shown that these approaches are immune to speckle noise.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ichirou Yamaguchi "Correlation techniques in speckle metrology and digital holography", Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70081E (22 April 2008); https://doi.org/10.1117/12.797343
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KEYWORDS
Speckle

Digital holography

Speckle pattern

Charge-coupled devices

Holograms

Phase shifts

Diffraction

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