Paper
16 May 2008 Use of first-order diffraction wavelengths corresponding to dual-grating periodicities in a single fiber Bragg grating for simultaneous temperature and strain measurement
S. P. Yam, Z. Brodzeli, S. A. Wade, G. W. Baxter, S. F. Collins
Author Affiliations +
Proceedings Volume 7004, 19th International Conference on Optical Fibre Sensors; 70045Z (2008) https://doi.org/10.1117/12.786906
Event: 19th International Conference on Optical Fibre Sensors, 2008, Perth, WA, Australia
Abstract
A fiber Bragg grating sensor fabricated by a phase mask with 536 nm uniform pitch is presented. Two peaks/dips occur, at 785 and 1552 nm, due to reflection/transmission at the Bragg wavelength and at double the Bragg wavelength, and arising from FBG periodicities associated with half the phase mask periodicity and the phase mask periodicity, respectively. It provides simultaneous measurement of temperature and longitudinal strain, with similar intensities in both wavelengths making it better suited for long-distance operation and multiplexing compared with similar schemes.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. P. Yam, Z. Brodzeli, S. A. Wade, G. W. Baxter, and S. F. Collins "Use of first-order diffraction wavelengths corresponding to dual-grating periodicities in a single fiber Bragg grating for simultaneous temperature and strain measurement", Proc. SPIE 7004, 19th International Conference on Optical Fibre Sensors, 70045Z (16 May 2008); https://doi.org/10.1117/12.786906
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KEYWORDS
Fiber Bragg gratings

Diffraction

Temperature metrology

Reflectivity

Sensors

Multiplexing

Transmittance

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