Paper
11 March 2008 Epitaxial growth and thermal dynamics of CeO2 buffer layer on textured Ni-W substrates for YBCO coated conductors
C. Y. Pan, C. B. Cai, L. L. Ying, Y. M. Lu, Z. Y. Liu, B. Gao, J. L. Liu
Author Affiliations +
Proceedings Volume 6984, Sixth International Conference on Thin Film Physics and Applications; 69840K (2008) https://doi.org/10.1117/12.792279
Event: Sixth International Conference on Thin Film Physics and Applications, 2007, Shanghai, China
Abstract
In present study, the biaxially textured CeO2 buffer layers on Ni-W substrates have been prepared by chemical solution deposition (CSD) with cerium acetate as the starting precursor, mixed with solvents of Propionic acid, Isopropanol and Acetylacetone. Typical XRD θ-2θ scans and the pole figure display well out-of-plane and in-plane textures of CeO2 films. SEM and AFM results suggest that the buffer layer have uniform and smooth surface. Meanwhile, the effects of heating rate on CeO2 formation starting from the precursor solution have been studied using differential thermal analysis (DTA). And the further analysis is given by XRD results for precursor xrogel at the corresponding temperature. Detailed high temperature optical microscope (HTOM) photographs investigate the surface characteristics evolved with temperature.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Y. Pan, C. B. Cai, L. L. Ying, Y. M. Lu, Z. Y. Liu, B. Gao, and J. L. Liu "Epitaxial growth and thermal dynamics of CeO2 buffer layer on textured Ni-W substrates for YBCO coated conductors", Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69840K (11 March 2008); https://doi.org/10.1117/12.792279
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KEYWORDS
Scanning electron microscopy

Annealing

Thermal analysis

Nickel

Atomic force microscopy

Cerium

Optical microscopes

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