Development of photonic crystal-based scene projection technology

J. Caulfield; B. Burckel; G. Ten Eyck; I. El-Kady; F. McCormick; J. Curzan; M. Massie; R. Stockbridge; D. Snyder

doi:10.1117/12.782020

16 April 2008 Development of photonic crystal-based scene projection technology

J. Caulfield, B. Burckel, G. Ten Eyck, I. El-Kady, F. McCormick, J. Curzan, M. Massie, R. Stockbridge, D. Snyder

Proceedings Volume 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII; 69420C (2008) https://doi.org/10.1117/12.782020
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

Cyan Systems is developing a new Extremely High Temperature Projector System Technology (XTEMPS). The XTEMPS is a multispectral emitter array based upon photonic crystals, providing high radiance and tailored spectral emission in infrared (IR) bands of interest. Cyan has teamed with a state of the art MEMS fabrication facility, Sandia National Laboratories, to develop metallic photonics crystals designed for scene projection systems. Photonic crystals have improved output power efficiency when compared to broad band "graybody" emitters due to limiting the emission to narrow bands. Photonic crystal based emitter pixels have potential for higher effective radiance output, while filtering out energy in the forbidden bandgap. Cyan has developed pixel designs using a medium format RIIC from Nova Sensors that ensures high apparent output temperatures with modest drive currents, and low voltage requirement goals of < 5 V. Cyan has developed a pixel structure for high radiative efficiency of the photonic lattice, while suppressing undesired IR sidelobes. Cyan will provide XTEMPS system performance metrics and illustrate with test structures.

Citation Download Citation

J. Caulfield, B. Burckel, G. Ten Eyck, I. El-Kady, F. McCormick, J. Curzan, M. Massie, R. Stockbridge, and D. Snyder "Development of photonic crystal-based scene projection technology", Proc. SPIE 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII, 69420C (16 April 2008); https://doi.org/10.1117/12.782020

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