Paper
29 January 2008 Developments at Finisar AOC
Author Affiliations +
Abstract
In 2007 Finisar® completed the transfer of an entire epitaxial and fabrication line from one facility to another. During this period, reliability models had to be re-validated and product continuity maintained. In this paper we describe the activities necessary to support such a transition, and we extend previously published VCSEL failure atlases.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Guenter, David Mathes, Bobby Hawkins, and Jim Tatum "Developments at Finisar AOC", Proc. SPIE 6908, Vertical-Cavity Surface-Emitting Lasers XII, 690805 (29 January 2008); https://doi.org/10.1117/12.771311
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Vertical cavity surface emitting lasers

Reliability

Semiconducting wafers

Failure analysis

Chemical elements

Data communications

Manufacturing

RELATED CONTENT

Highly reliable oxide VCSELs for datacom applications
Proceedings of SPIE (June 17 2003)
AOC moving forward: the impact of materials behavior
Proceedings of SPIE (February 10 2006)
A plot twist the continuing story of VCSELs at...
Proceedings of SPIE (March 14 2005)
VCSELs at Honeywell: The story continues
Proceedings of SPIE (June 16 2004)
Reliability of oxide VCSELs at Emcore
Proceedings of SPIE (June 16 2004)
Reliability and commercialization of oxidized VCSEL
Proceedings of SPIE (June 17 2003)

Back to Top