Feasibility study of enhanced total internal reflection fluorescence imaging using dielectric films

Kyujung Kim; Eun-Jin Cho; Yong-Min Huh; Donghyun Kim

doi:10.1117/12.765621

12 February 2008 Feasibility study of enhanced total internal reflection fluorescence imaging using dielectric films

Kyujung Kim, Eun-Jin Cho, Yong-Min Huh, Donghyun Kim

Proceedings Volume 6850, Multimodal Biomedical Imaging III; 68500R (2008) https://doi.org/10.1117/12.765621
Event: SPIE BiOS, 2008, San Jose, California, United States

Abstract

We present the sensitivity improvement of total internal reflection fluorescence microscopy for imaging intracellular molecular movements near cell membranes. We investigated employing dielectric films on a prism substrate for the enhancement of fluorescence emission intensity. A two-layer dielectric thin film structure using Al2O3 and SiO2 was designed and fabricated to provide the maximal field enhancement for 442 nm excitation at a reasonable angle of incidence (&Thgr;). The field enhancement achieved by the design was 8.5 at &Thgr; = 53.8º for TE polarization and confirmed experimentally using microbeads. Preliminary results in live cell imaging were obtained using quantum dots.

Citation Download Citation

Kyujung Kim, Eun-Jin Cho, Yong-Min Huh, and Donghyun Kim "Feasibility study of enhanced total internal reflection fluorescence imaging using dielectric films", Proc. SPIE 6850, Multimodal Biomedical Imaging III, 68500R (12 February 2008); https://doi.org/10.1117/12.765621

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