Dynamic measurement of normal spectral emissivity (at 905nm) by a pulse-heating reflectometric technique

Peng Xiao; Jingmin Dai; Zijun Wang

doi:10.1117/12.783214

17 January 2008 Dynamic measurement of normal spectral emissivity (at 905nm) by a pulse-heating reflectometric technique

Peng Xiao, Jingmin Dai, Zijun Wang

Author Affiliations +

Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 672321 (2008) https://doi.org/10.1117/12.783214
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

Pulse-heating experiments were performed on the strip specimen, taking the specimen from room temperature to melting point based on rapid resistive self-heating of the specimen. The normal spectral emissivity of the specimen was measured by integrating sphere reflectometry developed at HIT. At the same time, the radiance temperature is measured by high-speed pyrometer from 1100K to melting point. Details of the measurement technique, measurement apparatus and the calibration technique are described. Results of normal spectral emissivity of niobium at 905nm from room temperature to its melting point are presented and discussed.

Citation Download Citation

Peng Xiao, Jingmin Dai, and Zijun Wang "Dynamic measurement of normal spectral emissivity (at 905nm) by a pulse-heating reflectometric technique", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672321 (17 January 2008); https://doi.org/10.1117/12.783214

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