Micro-optics test bench at the ESRF

A. A. Snigirev; R. Hustache; P. Duboc; J.-Y. Massonnat; L. Claustre; P. Van Vaerenbergh; I. Snigireva; M. Grigoriev; V. Yunkin

doi:10.1117/12.732450

5 October 2007 Micro-optics test bench at the ESRF

A. A. Snigirev, R. Hustache, P. Duboc, J.-Y. Massonnat, L. Claustre, P. Van Vaerenbergh, I. Snigireva, M. Grigoriev, V. Yunkin

Author Affiliations +

Proceedings Volume 6705, Advances in X-Ray/EUV Optics and Components II; 670511 (2007) https://doi.org/10.1117/12.732450
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

A versatile instrument capable of high resolution X-ray optics characterization has been implemented at the ESRF. The Micro-Optics Test Bench (MOTB) is installed in EH2 of BM5 and is located 55 meters from the tangent point of a dipole magnet. Substantial gain has been demonstrated in the characterization of microfocusing and imaging optical elements, including diffractive, refractive and reflective optics.

Citation Download Citation

A. A. Snigirev, R. Hustache, P. Duboc, J.-Y. Massonnat, L. Claustre, P. Van Vaerenbergh, I. Snigireva, M. Grigoriev, and V. Yunkin "Micro-optics test bench at the ESRF", Proc. SPIE 6705, Advances in X-Ray/EUV Optics and Components II, 670511 (5 October 2007); https://doi.org/10.1117/12.732450

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