Paper
12 March 2008 Study of wavefront error and polarization of a side mounted infrared window
Author Affiliations +
Proceedings Volume 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing; 66241Y (2008) https://doi.org/10.1117/12.791193
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
The wavefront error and polarization of a side mounted infrared window made of ZnS are studied. The Infrared windows suffer from temperature gradient and stress during their launch process. Generally, the gradient in temperature changes the refractive index of the material whereas stress produces deformation and birefringence. In this paper, a thermal finite element analysis (FEA) of an IR window is presented. For this purpose, we employed an FEA program Ansys to obtain the time-varying temperature field. The deformation and stress of the window are derived from a structural FEA with the aerodynamic force and the temperature field previously obtained as being the loads. The deformation, temperature field, stress field, ray tracing and Jones Calculus are used to calculate the wavefront error and the change of polarization state.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiaguo Liu, Lin Li, Xinqi Hu, and Xin Yu "Study of wavefront error and polarization of a side mounted infrared window", Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241Y (12 March 2008); https://doi.org/10.1117/12.791193
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Cited by 2 scholarly publications.
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KEYWORDS
Wavefronts

Finite element methods

Refractive index

Polarization

Aerodynamics

Infrared radiation

Birefringence

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