Readout durability improvement of super-resolution near-field structure disc using germanium nitride interface layers

Takayuki Shima; Yuzo Yamakawa; Junji Tominaga; Jooho Kim

doi:10.1117/12.738929

11 July 2007 Readout durability improvement of super-resolution near-field structure disc using germanium nitride interface layers

Takayuki Shima, Yuzo Yamakawa, Junji Tominaga, Jooho Kim

Author Affiliations +

Proceedings Volume 6620, Optical Data Storage 2007; 662011 (2007) https://doi.org/10.1117/12.738929
Event: Optical Data Storage 2007, 2007, Portland, OR, United States

Abstract

Inserting germanium nitride thin films between Sb-Te (for super-resolution readout) and ZnS-SiO₂ layers was effective to improve super-resolution readout durability of a super-RENS disc using a PtO_x-SiO₂ write-once recording layer. Waveform of 97-nm (that is below the resolution limit of the optics used) and 340-nm combined marks scarcely changed even after 50,000 times readout. CNR of 100 nm marks was stable (within 3 dB decrease) after 268,000 times readout.

Citation Download Citation

Takayuki Shima, Yuzo Yamakawa, Junji Tominaga, and Jooho Kim "Readout durability improvement of super-resolution near-field structure disc using germanium nitride interface layers", Proc. SPIE 6620, Optical Data Storage 2007, 662011 (11 July 2007); https://doi.org/10.1117/12.738929

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