IR Material Characterization

J C Thuillier

doi:10.1117/12.938540

22 November 1986 IR Material Characterization

J C Thuillier

Proceedings Volume 0659, Materials Technologies for Infrared Detectors; (1986) https://doi.org/10.1117/12.938540
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

Characterization is an important activity in the field of semiconductors. Many different methods are available using various physical effects. We focus this paper on the transport phenomena and an example of study is given on HgTe/CdTe super lattices.

Citation Download Citation

J C Thuillier "IR Material Characterization", Proc. SPIE 0659, Materials Technologies for Infrared Detectors, (22 November 1986); https://doi.org/10.1117/12.938540

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