Paper
17 February 2007 Evaluation of two and a half dimensional surface data with form component and groove bands
Author Affiliations +
Proceedings Volume 6503, Machine Vision Applications in Industrial Inspection XV; 65030D (2007) https://doi.org/10.1117/12.698505
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States
Abstract
Machine work pieces with ground, broached or milled surfaces have frequently microtextures consisting of stochastically placed straight tool marks. In this paper we'll exploit the depth data acquired by white-light interferometer for the surface analysis. We present a new algorithm for efficiently extracting extensive groove bands from depth images. The images are treated as a composition of shape component, straight line structures and background. The cylindrical shape component is extracted using robust least squares methods. The outliers are removed by adaptive center weighted median filter. The undefined regions due to sensor failures are interpolated using successive over-relaxation algorithm. An algorithm for the separation of groove bands is introduced. Straight line in three-dimensional space is parameterized and used as primitive for groove separation. After having determined the orientation of the groove band, straight line segment produced with Digital Differential Analyzer can be used by the scanning algorithm for estimating the straight lines. This decomposition enables a separate evaluation of different components of the surface data. The results of the pre-processings and the separation turn out to be fast and robust, which is verified by real depth data.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Binjian Xin "Evaluation of two and a half dimensional surface data with form component and groove bands", Proc. SPIE 6503, Machine Vision Applications in Industrial Inspection XV, 65030D (17 February 2007); https://doi.org/10.1117/12.698505
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KEYWORDS
Digital filtering

Image filtering

Interferometers

Metrology

Image segmentation

Sensors

Fourier transforms

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