Paper
20 May 2006 Design for manufacturability production management activity report
Norihiko Miyazaki, T. Sato, M. Honma, N. Yoshioka, K. Hosono, T. Onodera, H. Itoh, H. Suzuki, T. Uga, K. Kadota, N. Iriki
Author Affiliations +
Abstract
Design For Manufacturability Production Management (DFM-PM) Subcommittee has been started in succession to Reticle Management Subcommittee (RMS) in Semiconductor Manufacturing Technology Committee for Japan (SMTCJ) from 2005. Our activity focuses on the SoC (System On Chip) Business, and it pursues the improvement of communication in manufacturing technique. The first theme of activity is the investigation and examination of the new trends about production (manufacturer) technology and related information, and proposals of business solution. The second theme is the standardization activity about manufacture technology and the cooperation with related semiconductors' organizations. And the third theme is holding workshop and support for promotion and spread of the standardization technology throughout semiconductor companies. We expand a range of scope from design technology to wafer pattern reliability and we will propose the competition domain, the collaboration area and the standardization technology on DFM. Furthermore, we will be able to make up a SoC business model as the 45nm node technology beyond manufacturing platform in cooperating with the design information and the production information by utilizing EDA technology.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norihiko Miyazaki, T. Sato, M. Honma, N. Yoshioka, K. Hosono, T. Onodera, H. Itoh, H. Suzuki, T. Uga, K. Kadota, and N. Iriki "Design for manufacturability production management activity report", Proc. SPIE 6283, Photomask and Next-Generation Lithography Mask Technology XIII, 628302 (20 May 2006); https://doi.org/10.1117/12.681729
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KEYWORDS
Design for manufacturing

Photomasks

Manufacturing

Design for manufacturability

Reticles

Standards development

Inspection

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