Paper
15 June 2006 Faint flux performance of an EMCCD
Author Affiliations +
Abstract
Thorough numerical simulations were run to test the performance of three processing methods of the data coming out from an electron multiplying charge coupled device (EMCCD), or low light level charge coupled device (L3CCD), operated at high gain, under real operating conditions. The effect of read-out noise and spurious charges is tested under various low flux conditions (0.001 event/pixel/frame< f < 20 events/pixel/frame). Moreover, a method for finding the value of the gain applied by the EMCCD amplification register is also developed. It allows one to determine the gain value to an accuracy of a fraction of a percent from dark frames alone.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olivier Daigle, Claude Carignan, and Sébastien Blais-Ouellette "Faint flux performance of an EMCCD", Proc. SPIE 6276, High Energy, Optical, and Infrared Detectors for Astronomy II, 62761F (15 June 2006); https://doi.org/10.1117/12.669433
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Cited by 20 scholarly publications.
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KEYWORDS
Signal to noise ratio

Electron multiplying charge coupled devices

Signal processing

Charge-coupled devices

Photon counting

Digital signal processing

Quantum efficiency

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