Two-dimensional measurement of optical parameters using inverse source problem and phase-shifting technique: optical scheme modeling

Georgi Stoilov

doi:10.1117/12.677289

9 June 2006 Two-dimensional measurement of optical parameters using inverse source problem and phase-shifting technique: optical scheme modeling

Georgi Stoilov

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Proceedings Volume 6252, Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information; 625224 (2006) https://doi.org/10.1117/12.677289
Event: Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information, 2005, Varna, Bulgaria

Abstract

The inverse source problem is solved by utilization of reverse Fourier transformation of the light, transmitted through the object. Phase-shifting technique for obtaining the information on the phase distribution during measurement is proposed. This allows calculation of the transmission coefficient and phase delay in every point of the object. The incorporation of a reference measurement eliminates the influence of the measurement system parameters. The theoretical background is shown. A computer simulation of the influence of the more important factors of the optical scheme on the accuracy is presented. Simulation is done for different positions of the basic optical elements and inexact phase shifting. Different ADC resolutions are simulated too. Conditions and limits of measurement are discussed. This technique could be used in measurement and qualification of small and micro objects in biology.

Citation Download Citation

Georgi Stoilov "Two-dimensional measurement of optical parameters using inverse source problem and phase-shifting technique: optical scheme modeling", Proc. SPIE 6252, Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information, 625224 (9 June 2006); https://doi.org/10.1117/12.677289

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KEYWORDS

Phase shifts

Inverse optics

Cameras

CCD cameras

Interferometry

Optical testing

Beam splitters

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