Paper
22 May 2006 Readability evaluation of an active matrix electrophoric ink display
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Abstract
A low-power, yet sunlight readable, display is needed for dismounted applications where the user must carry the power source. Such a display could potentially replace paper checklists and maps with electronic counterparts. A reflective active matrix electrophoretic ink display (AMEPID) was evaluated as a candidate technology for such applications. This display technology uses ambient illumination, rather than competing with it, and requires power only when rewriting the display. The device was tested for viewability under a variety of lighting conditions. Readability of displayed text, as compared to standard print on white paper, was evaluated in an indoor office environment and in outdoor lighting conditions. Viewability of the display with night vision goggles (NVGs) was evaluated under simulated full moon, starlight, and overcast illumination conditions. Objective measurements of luminance, contrast ratio and reflectance were conducted under corresponding irradiance conditions and viewing angles using state-of-the-art photometric and radiometric measurement equipment. In addition to visible spectrum measurements, infrared (IR) reflectance and contrast were measured for the extended spectrum of 720-1700 nm. Results are discussed in terms of performance criteria for military displays, which are often much more demanding than for civil applications.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederick M. Meyer, Terry L. Trissell, Denise L. Aleva, Sam J. Longo, and Darrel G. Hopper "Readability evaluation of an active matrix electrophoric ink display", Proc. SPIE 6225, Defense, Security, Cockpit, and Future Displays II, 622507 (22 May 2006); https://doi.org/10.1117/12.668900
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Cited by 1 scholarly publication.
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KEYWORDS
Reflectivity

Standards development

Visualization

Flat panel displays

LCDs

Light sources and illumination

Metrology

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