Paper
28 February 2006 An investigation into changes observed in the oscillation characteristics of semiconductor lasers exposed to magnetic fields
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Abstract
The application of magnetic fields to semiconductor lasers gives rise to significant alterations in their oscillation wavelengths. Reports dating back to the 1960's describe shifts to shorter oscillation wavelengths, at extremely low temperatures (80K) and strong magnetic fields (~4T). These shifts were explained by the effect of the Landau Level. In our preliminary experiments, we exposed bulk-type semiconductor lasers oscillating at 780nm to a relatively weak magnetic field (1.4T), at room temperature (300K), observing, in the process, that the oscillation wavelength shifted to the longer (low-frequency) side. This work looks at the longer side shift, the optical output-power shift on the low-power side, and the terminal-voltage shift seen on the higher voltage side of some multi-quantum-well (MQW) laser diodes oscillating at 780nm, under the same experimental conditions we employed in previous works. In discussions of shift mechanisms, we consider how wavelength (frequency), optical output-power, and terminal voltage-shifts are correlated. Our expanded knowledge base has forced a complete rethink of the mechanisms we relied upon in the 1960's. Current evidence suggests that the temperature rise and the longitudinal magneto-resistance effect were "co-conspirators" in the shifts observed in our experiments, when we applied magnetic fields to laser diodes parallel to the injection current. In an upcoming report, we will describe the results of experiments conducted near the threshold current.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Miyamoto, J. Chiba, T. Sato, M. Ohkawa, and T. Maruyama "An investigation into changes observed in the oscillation characteristics of semiconductor lasers exposed to magnetic fields", Proc. SPIE 6115, Physics and Simulation of Optoelectronic Devices XIV, 61150Z (28 February 2006); https://doi.org/10.1117/12.645485
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Cited by 2 scholarly publications.
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KEYWORDS
Magnetism

Semiconductor lasers

Diodes

Resistance

Laser damage threshold

Laser optics

Temperature metrology

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