Paper
28 February 2006 Silicon flip-chip imaging with a resolution of 325-nm using solid-immersion lenses and the two-photon optical-beam induced current method
Euan Ramsay, Nicholas Pleynet, Dong Xiao, Richard J. Warburton, Derryck T. Reid
Author Affiliations +
Abstract
This paper reports the imaging of a silicon flip-chip with high resolution by detection of the photocurrent generated by the two-photon absorption of 1530nm light from a femtosecond Er:fiber laser. High resolution imaging was made possible by the inclusion of a silicon solid immersion lens, which increased the numerical aperture of the microscope. Using this technique, features on a sub-micron scale are clearly resolvable with excellent contrast, and the resolution of the system was found to be 325nm.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Euan Ramsay, Nicholas Pleynet, Dong Xiao, Richard J. Warburton, and Derryck T. Reid "Silicon flip-chip imaging with a resolution of 325-nm using solid-immersion lenses and the two-photon optical-beam induced current method", Proc. SPIE 6108, Commercial and Biomedical Applications of Ultrafast Lasers VI, 61080G (28 February 2006); https://doi.org/10.1117/12.645629
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KEYWORDS
Image resolution

Silicon

Refractive index

Microscopes

Absorption

Objectives

Solids

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