Paper
27 October 2006 Measurement of sugar content of watermelon using near-infrared reflectance spectroscopy in comparison with dielectric property
Xuemei Tao, Yidan Bao
Author Affiliations +
Proceedings Volume 6047, Fourth International Conference on Photonics and Imaging in Biology and Medicine; 60473V (2006) https://doi.org/10.1117/12.710921
Event: Fourth International Conference on Photonics and Imaging in Biology and Medicine, 2005, Tianjin, China
Abstract
The sugar content of watermelon is important to its taste thus influences the market. It's difficult to know whether the melon is sweet or not for consumers. We tried to develop a convenient meter to determine the sugar of watermelon. The first objective of this paper was to demonstrate the feasibility of using a near-infrared reflectance spectrometer (NIRS) to investigate the relationship between sugar content of watermelon and absorption spectra. The NIRS reflectance of nondestructive watermelon was measured with a Visible/NIR spectrophotometer in 325-1075nm range. The sugar content of watermelon was obtained with a handhold sugar content meter. The second objective was to measure the watermelon's dielectric property, such as dielectric resistance, capacitance, quality factor and dielectric loss. A digital electric bridge instrument was used to get the dielectric property. The experimental results show that they were related to watermelon's sugar content. A comparison between the two methods was made in the paper. The model derived from NIRS reflection is useful for class identification of Zaochun Hongyu watermelon though it's not quite accurate in sweetness prediction (the max. deviation is 0.7). Electric property bears little relation to sugar content of watermelon at this experiment and it couldn't be used as non-destructive inspection method.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xuemei Tao and Yidan Bao "Measurement of sugar content of watermelon using near-infrared reflectance spectroscopy in comparison with dielectric property", Proc. SPIE 6047, Fourth International Conference on Photonics and Imaging in Biology and Medicine, 60473V (27 October 2006); https://doi.org/10.1117/12.710921
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Cited by 2 scholarly publications.
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KEYWORDS
Dielectrics

Reflectivity

Calibration

Near infrared spectroscopy

Capacitance

Nondestructive evaluation

Inspection

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