Paper
21 March 2006 A new method for calculating the microstructural stiffness of MEMS devices
Yu Liu, Zhiyu Wen, Liuqiang Zhang, Yuqian Liang
Author Affiliations +
Proceedings Volume 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials; 604005 (2006) https://doi.org/10.1117/12.664132
Event: ICMIT 2005: Merchatronics, MEMS, and Smart Materials, 2005, Chongqing, China
Abstract
The stiffness of microstructures is an important parameter for MEMS devices. This parameter is usually obtained by using a FEM approach, from which it is difficult to obtain an analytical expression. A microaccelerometer with a complex microstructure was designed in the present study. Its main-axial stiffness was calculated by a force method and energy method. The theoretical results are consistent with that of the FEM approach. After applying this method to the stiffness analysis of other MEMS devices, such as a micromirror, symmetric four-beam structure, and a typical combfinger capacitive microaccelerometer, it can be concluded that this methodology is applicable to the stiffness analysis of symmetric and statically indeterminate microstructures.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu Liu, Zhiyu Wen, Liuqiang Zhang, and Yuqian Liang "A new method for calculating the microstructural stiffness of MEMS devices", Proc. SPIE 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials, 604005 (21 March 2006); https://doi.org/10.1117/12.664132
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KEYWORDS
Microelectromechanical systems

Micromirrors

Finite element methods

Analytical research

Device simulation

Protactinium

Microsensors

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