Paper
7 December 2006 X-ray Cherenkov radiation produced in multilayers
M. A. Aginian, L. A. Gevorgian, K. A. Ispirian, M. K. Ispiryan
Author Affiliations +
Proceedings Volume 5974, International Conference on Charged and Neutral Particles Channeling Phenomena; 59740P (2006) https://doi.org/10.1117/12.640000
Event: International Conference on Charged and Neutral Particles Channeling Phenomena, 2004, Rome, Italy
Abstract
It is well known that when some conditions are fulfilled the intensity of the radiation produced by high energy particles in stratified media or the so-called "parametric Cherenkov radiation" is enhanced. On the other hand, it has been predicted and observed that in some materials the dielectric constant is greater than 1 in X-ray region near the absorption edges, and quasimonochromatic X-ray Cherenkov radiation (XCR) photons are produced with certain angular and narrow spectral distributions. Recently new formulae have been derived by the coherent summation method for the radiation produced by fast charged particles in multilayers consisting of thin alternating layers of two materials with different dielectric constants. In difference from the coherent transition radiation formulae obtained in WKB approximation or coherent summation method the new formulae take into account the reflection from the interfaces and is valid when the dielectric constants are greater andor less than 1. In this work we study the angular and spectral distributions of XCR using these formulae, compare the obtained results with the results obtained theoretically and experimentally in other works and discuss some possible experiments.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. A. Aginian, L. A. Gevorgian, K. A. Ispirian, and M. K. Ispiryan "X-ray Cherenkov radiation produced in multilayers", Proc. SPIE 5974, International Conference on Charged and Neutral Particles Channeling Phenomena, 59740P (7 December 2006); https://doi.org/10.1117/12.640000
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photons

X-rays

Electrons

Dielectrics

Particles

Absorption

Interfaces

Back to Top