Contamination influence on receptacle type optical data links

Scott Takahashi; Yutaka Sadohara; Carla Gleason; Tatiana Berdinskikh; Thomas Mitcheltree; Steve Lytle

doi:10.1117/12.632205

12 October 2005 Contamination influence on receptacle type optical data links

Scott Takahashi, Yutaka Sadohara, Carla Gleason, Tatiana Berdinskikh, Thomas Mitcheltree, Steve Lytle

Proceedings Volume 5970, Photonic Applications in Devices and Communication Systems; 597004 (2005) https://doi.org/10.1117/12.632205
Event: Photonics North, 2005, Toronto, Canada

Abstract

The paper summarizes the research of the iNEMI (International Manufacturing Initiatives) project on Fiber Connector Endface Specifications focused on the development of the cleanliness specification of the receptacle modules. It will discuss (1) the critical parameters of Small Form-Factor (SFF&SFP) modules sensitive to the contamination, (2) the experimental contamination techniques, (3) the test and measurement methodology, as well as (4) the Gage R & R (Repeatability & Reproducibility) studies. We choose one of the standard OC-48, SFF modules manufactured by Sumitomo Electric as the experimental vehicle for the project. The influence of the SiO2 based dust with the particle size under 149 um on optical performance of SFF module has been investigated. The Optical Return Loss (ORL) has been identified as the most sensitive parameter to the contamination for the both transmitter and receiver optical endface. In a case of changes of the transmitter ORL by 20-25 dB due to the application of the contamination, the optical power and spectral width didn't change, and the pulse mask was reduced only by 2%. The contamination near the core area caused changes of the ORL by 20-30dB, and high standard deviation of ORL (0.5-2.1 dB). The Gage R & R study was focused on investigation of equipment repeatability, mating repeatability, and operator dependence for ORL measurement of clean and contaminated optical endface. The proposed experimental methodology was able to achieve all Gage R & R parameters within the required limits.

Citation Download Citation

Scott Takahashi, Yutaka Sadohara, Carla Gleason, Tatiana Berdinskikh, Thomas Mitcheltree, and Steve Lytle "Contamination influence on receptacle type optical data links", Proc. SPIE 5970, Photonic Applications in Devices and Communication Systems, 597004 (12 October 2005); https://doi.org/10.1117/12.632205

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available