Stability of high-pressure xenon gamma-ray spectrometers

Albert Beyerle

doi:10.1117/12.622628

16 September 2005 Stability of high-pressure xenon gamma-ray spectrometers

Albert Beyerle

Proceedings Volume 5922, Hard X-Ray and Gamma-Ray Detector Physics VII; 59220C (2005) https://doi.org/10.1117/12.622628
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

The stability of high-pressure xenon gamma-ray specrometers has been measured at Mirmar Sensor. Stability was measured by tracking the ¹³⁷Cs peak of the entire spectroscopy system including detector, preamplifier, amplifier, and multichannle analyzer over 6 days in a laboratory setting. Overall system gain drift is about 0.016%. Resolution drifts are about 0.15%. The overall energy resolution is between 1.7 and 1.8% at 662 keV.

Citation Download Citation

Albert Beyerle "Stability of high-pressure xenon gamma-ray spectrometers", Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 59220C (16 September 2005); https://doi.org/10.1117/12.622628

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