How to detect object-caused illumination effects in 3D fringe projection

Christoph Munkelt; Peter Kuhmstedt; Matthias Heinze; Herbert Suesse; Gunther Notni

doi:10.1117/12.612895

13 June 2005 How to detect object-caused illumination effects in 3D fringe projection

Christoph Munkelt, Peter Kuhmstedt, Matthias Heinze, Herbert Suesse, Gunther Notni

Proceedings Volume 5856, Optical Measurement Systems for Industrial Inspection IV; (2005) https://doi.org/10.1117/12.612895
Event: Optical Metrology, 2005, Munich, Germany

Abstract

3D measurement of the shape of rough structures can be realised with structured light illumination techniques. Several problems can arise while measuring complex object geometries with these techniques. Complex objects are characterized, f.e. by deep holes, walls, concave and convex corner-like shaped surface structures. When illuminating the object, one part of the object can "illuminate" another one, yielding locally spurious fringe patterns. Due to these spurious fringe patterns the phase values are strongly distorted significantly increasing the measurement noise locally. Here we propose methods how to detect and to avoid these spurious fringe patterns. The idea is to use the overestimated information which is contained in the graycode and the sinusoidal intensity distribution. On the basis of this procedure, an operator is defined which results in a mask operation. With this new method we can reduce the noise amplitude. In this paper, the detection and reduction of the illumination effect using this operator will be demonstrated while measuring different object geometries.

Citation Download Citation

Christoph Munkelt, Peter Kuhmstedt, Matthias Heinze, Herbert Suesse, and Gunther Notni "How to detect object-caused illumination effects in 3D fringe projection", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612895

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available