Advanced process and device modeling of full-frame CCD imagers

Carl J. Wordelman; Edmund K. Banghart

doi:10.1117/12.591143

28 April 2005 Advanced process and device modeling of full-frame CCD imagers (Invited Paper)

Proceedings Volume 5722, Physics and Simulation of Optoelectronic Devices XIII; (2005) https://doi.org/10.1117/12.591143
Event: Integrated Optoelectronic Devices 2005, 2005, San Jose, California, United States

Abstract

Using Synopsys TCAD tools, several examples of advanced process and device modeling are presented for full-frame CCD image sensors. The topics covered in these examples include channel potential, charge capacity, charge transport, and charge blooming. The simulations provide in depth analysis of the basic principles of operation of CCDs and cover some aspects of antiblooming protection.

Citation Download Citation

Carl J. Wordelman and Edmund K. Banghart "Advanced process and device modeling of full-frame CCD imagers (Invited Paper)", Proc. SPIE 5722, Physics and Simulation of Optoelectronic Devices XIII, (28 April 2005); https://doi.org/10.1117/12.591143

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