Exact synthesis of dielectric thin film filters

Agnieszka Rowinska-Schwarzweller; Norbert Fruehauf

doi:10.1117/12.559791

29 September 2004 Exact synthesis of dielectric thin film filters

Agnieszka Rowinska-Schwarzweller, Norbert Fruehauf

Proceedings Volume 5527, Advances in Thin Film Coatings for Optical Applications; (2004) https://doi.org/10.1117/12.559791
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

An exact design method for multilayer dielectric thin film filters of uniform optical thickness based on a frequency transformation and classical lossless filter synthesis is introduced. The proposed method consists of finding the optimal realizable inverse transmittance function (power loss ratio) which fulfills additional constraints such as number of layers and the calculation of the refractive indices of the individual layers. The proposed algorithm can easily be implemented because it only requires determining the roots of a polynomial. In contrast to known methods the proposed method is not limited to symmetrical multilayers or filters with geometric symmetry and allows for both reflective and transmissive characteristics of the optical filter. Several designs based on the new algorithm will be presented to demonstrate the usefulness of the exact synthesis procedure. The resulting filters can be transformed into filters with readily available indices using a known transform algorithm.

Citation Download Citation

Agnieszka Rowinska-Schwarzweller and Norbert Fruehauf "Exact synthesis of dielectric thin film filters", Proc. SPIE 5527, Advances in Thin Film Coatings for Optical Applications, (29 September 2004); https://doi.org/10.1117/12.559791

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