Coherent tools for physical-based simulation and characterization of noise in semiconductor devices oriented to nonlinear microwave circuit CAD

Zoheir Riah; Raphael Sommet; Jean Christophe Nallatamby; Michel Prigent; Juan Obregon

doi:10.1117/12.546513

25 May 2004 Coherent tools for physical-based simulation and characterization of noise in semiconductor devices oriented to nonlinear microwave circuit CAD

Zoheir Riah, Raphael Sommet, Jean Christophe Nallatamby, Michel Prigent, Juan Obregon

Author Affiliations +

Proceedings Volume 5470, Noise in Devices and Circuits II; (2004) https://doi.org/10.1117/12.546513
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain

Abstract

We present in this paper a set of coherent tools for noise characterization and physics-based analysis of noise in semiconductor devices. This noise toolbox relies on a low frequency noise measurement setup with special high current capabilities thanks to an accurate and original calibration. It relies also on a simulation tool based on the drift diffusion equations and the linear perturbation theory, associated with the Green's function technique. This physics-based noise simulator has been implemented successfully in the Scilab environment and is specifically dedicated to HBTs. Some results are given and compared to those existing in the literature.

Citation Download Citation

Zoheir Riah, Raphael Sommet, Jean Christophe Nallatamby, Michel Prigent, and Juan Obregon "Coherent tools for physical-based simulation and characterization of noise in semiconductor devices oriented to nonlinear microwave circuit CAD", Proc. SPIE 5470, Noise in Devices and Circuits II, (25 May 2004); https://doi.org/10.1117/12.546513

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