Paper
10 September 2004 A 3D scanning device for architectural survey based on time-of-flight technology
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Abstract
This work is intended to show the results of a few architectural and archaeological surveys realized by means of a 3D scanning device, based on TOF (Time-Of-Flight) technology. The instrument was set up by the Art Diagnostic Group of the National Institute for Applied Optics (INOA) and it is composed by a high precision scanning system equipped with a commercial low-cost distance-meter. This device was projected in order to provide the following characteristics: reliability, good accuracy and compatibility with other systems and it is devoted to applications in Cultural Heritage field.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raffaella Fontana, Maria Chiara Gambino, Gabriella Gianfrate, Marinella Greco, Enrico Pampaloni, and Luca Pezzati "A 3D scanning device for architectural survey based on time-of-flight technology", Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); https://doi.org/10.1117/12.545629
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Cited by 7 scholarly publications.
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KEYWORDS
3D modeling

Laser scanners

3D scanning

3D metrology

3D-TOF imaging

Data modeling

Scanners

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