Study of stress gradients using computer simulation of diffraction data

Joaquim T. de Assis; Vladimir I. Monin; Sergei A. Filippov; Antonio Merendaz

doi:10.1117/12.555459

5 April 2004 Study of stress gradients using computer simulation of diffraction data

Joaquim T. de Assis, Vladimir I. Monin, Sergei A. Filippov, Antonio Merendaz

Proceedings Volume 5400, Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2004) https://doi.org/10.1117/12.555459
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

Difficulties of determination of surface stress gradients using X-ray diffraction technique are connected with interpretation of non-linearity of θ_φ,ψ versus sin²ψ experimental curves. The problem is that the scattering of experimental data conceals a non-linear character of sin²ψ dependency and does not allow to determine correctly the parameters of stress gradient. The solution of this problem can be resolved experimentally by stress analysis of a sample with known parameters of stress gradients or by computer simulation of a diffraction profile created by surface layers with stress gradient. The first is not successful because of the difficulty to make the samples with the known parameters of stress gradient. The second is more productive because it allows to simulate an experimental θ_φ,ψ versus sin²ψ dependency and to obtain the relationships between stress gradient parameters and non-linearity of sin²ψ plots. Computer simulation of diffraction data presented in this paper permits also to analyze directly the broadening of diffraction line caused by stress gradient.

Citation Download Citation

Joaquim T. de Assis, Vladimir I. Monin, Sergei A. Filippov, and Antonio Merendaz "Study of stress gradients using computer simulation of diffraction data", Proc. SPIE 5400, Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (5 April 2004); https://doi.org/10.1117/12.555459

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KEYWORDS

Diffraction

Computer simulations

X-ray diffraction

X-rays

Absorption

Stress analysis

Chromium

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