Portable x-ray apparatus for stress measurements

Vladimir I. Monin; Joaquim T. de Assis; Fernando Ruthai Pereira; Sergei A. Filippov; Tatiana Gurova; Joel R. Teodosio; H. F. Abreu

doi:10.1117/12.555449

5 April 2004 Portable x-ray apparatus for stress measurements

Vladimir I. Monin, Joaquim T. de Assis, Fernando Ruthai Pereira, Sergei A. Filippov, Tatiana Gurova, Joel R. Teodosio, H. F. Abreu

Author Affiliations +

Proceedings Volume 5400, Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2004) https://doi.org/10.1117/12.555449
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

Portable apparatus presented in this paper is an x-ray equipment permitting to carry out traditional stress determination by x-ray diffraction method both in-laboratory and in-field conditions. The portability of apparatus is achieved by construction of compact and light high voltage source coupled with special x-ray tube and using of coordinate sensitive detector. Other distinctive characteristic of apparatus is an absence of a goniometer. Special collimator and simple meter of incidence angle permit to substitute the goniometer and to carry out the stress measurements of different industrial equipments such as pipelines, tanks. Software program executes a control of measurement procedure and carries out data processing experimental results.

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Vladimir I. Monin, Joaquim T. de Assis, Fernando Ruthai Pereira, Sergei A. Filippov, Tatiana Gurova, Joel R. Teodosio, and H. F. Abreu "Portable x-ray apparatus for stress measurements", Proc. SPIE 5400, Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (5 April 2004); https://doi.org/10.1117/12.555449

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