Defects and friction in alkylsilane self-assembled monolayers

Michael Chandross; Gary S. Grest; Mark J. Stevens; Edmund B. Webb III

doi:10.1117/12.524562

23 December 2003 Defects and friction in alkylsilane self-assembled monolayers

Michael Chandross, Gary S. Grest, Mark J. Stevens, Edmund B. Webb III

Proceedings Volume 5343, Reliability, Testing, and Characterization of MEMS/MOEMS III; (2003) https://doi.org/10.1117/12.524562
Event: Micromachining and Microfabrication, 2004, San Jose, California, United States

Abstract

The adhesion and friction between pairs of self-assembled monolayers (SAMs) of alkylsilane chains on a silicon dioxide surface are studied using molecular dynamics simulations. We study chains with n=6, 8, 12, and 18 carbons in the backbone for both fully packed and defected monolayers. The defects are introduced by the random removal of chains from a well-ordered crystalline substrate. The adhesion force between monolayers at a given separation is found to increase monotonically with chain length and with coverage for a fixed chain length for the crystalline substrate. Friction simulations were performed at a relative shear velocity of 2 m/s at constant applied loads between 200 and 600 MPa. Stick slip motion is observed at full coverage, but disappears with the inclusion of 10% defects. We find that with the addition of random defects, the friction becomes insensitive to both chain length and defect density.

Citation Download Citation

Michael Chandross, Gary S. Grest, Mark J. Stevens, and Edmund B. Webb III "Defects and friction in alkylsilane self-assembled monolayers", Proc. SPIE 5343, Reliability, Testing, and Characterization of MEMS/MOEMS III, (23 December 2003); https://doi.org/10.1117/12.524562

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