Paper
3 May 2004 A SOM-based system for web surface inspection
Jukka Iivarinen, Jussi Pakkanen, Juhani Rauhamaa
Author Affiliations +
Proceedings Volume 5303, Machine Vision Applications in Industrial Inspection XII; (2004) https://doi.org/10.1117/12.526617
Event: Electronic Imaging 2004, 2004, San Jose, California, United States
Abstract
In this paper a system for web surface inspection is described. It has three parts: an image acquisition part, a defect detection part, and a defect classification part. The self-organizing maps (SOMs) are used both in defect detection and in defect classification which makes the system adaptable to different types of surfaces and defects. Our main focus is on defect classification where a generic content-based image retrieval (CBIR) system called PicSOM is utilized. The PicSOM uses tree-structured SOMs (TS-SOMs) and relevance feedback. It is trained with the feature sets of the defects in the database. For defect description, features from the MPEG-7 standard (the homogeneous texture, the color structure, and the edge histogram) are used and for the shape description our own shape feature set is applied. Results indicate that the system works with a high level of success.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jukka Iivarinen, Jussi Pakkanen, and Juhani Rauhamaa "A SOM-based system for web surface inspection", Proc. SPIE 5303, Machine Vision Applications in Industrial Inspection XII, (3 May 2004); https://doi.org/10.1117/12.526617
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Databases

Inspection

Image segmentation

Defect detection

Feature extraction

Image retrieval

Cameras

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