X-ray laser-induced time-of-flight photoelectron spectroscopy

Art J. Nelson; James Dunn; Tony W. van Buuren; Jim Hunter; Ray F. Smith; Oliver Hemmers; Dennis W. Lindle

doi:10.1117/12.506162

19 December 2003 X-ray laser-induced time-of-flight photoelectron spectroscopy

Art J. Nelson, James Dunn, Tony W. van Buuren, Jim Hunter, Ray F. Smith, Oliver Hemmers, Dennis W. Lindle

Proceedings Volume 5197, Soft X-Ray Lasers and Applications V; (2003) https://doi.org/10.1117/12.506162
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

X-ray laser induced time-of-flight photoelectron spectroscopy has been used to probe the core-level and valence band electronic structure of room-temperature bulk materials with picosecond time resolution. The LLNL COMET compact tabletop x-ray laser source provides the necessary high photon flux, high energy, monochromaticity, picosecond pulse duration, and coherence for probing ultrafast changes in the chemical and electronic structure of these materials. Valence band and core-level spectra were recorded for transition metal surfaces. In situ sputter etching with Ar ions at 30° incidence will be implemented to improve the surface purity and consequently increase core-level and valence-band photoemission intensity. This work demonstrates a powerful new technique for probing reaction dynamics and for probing changes of local order on surfaces on their fundamental timescales. Future work will include the study of fundamental phenomena such as non-thermal melting, chemical bond formation, intermediate reaction steps, and the existence of transient reaction products.

Citation Download Citation

Art J. Nelson, James Dunn, Tony W. van Buuren, Jim Hunter, Ray F. Smith, Oliver Hemmers, and Dennis W. Lindle "X-ray laser-induced time-of-flight photoelectron spectroscopy", Proc. SPIE 5197, Soft X-Ray Lasers and Applications V, (19 December 2003); https://doi.org/10.1117/12.506162

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