X-ray study of W/Si multilayers for the HEFT hard x-ray telescope

Kristin K. Madsen; Finn E. Christensen; Carsten P. Jensen; Eric Ziegler; William W. Craig; Kurt S. Gunderson; Jason E. Koglin; K. Pedersen

doi:10.1117/12.505665

29 January 2004 X-ray study of W/Si multilayers for the HEFT hard x-ray telescope

Kristin K. Madsen, Finn E. Christensen, Carsten P. Jensen, Eric Ziegler, William W. Craig, Kurt S. Gunderson, Jason E. Koglin, K. Pedersen

Author Affiliations +

Proceedings Volume 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy; (2004) https://doi.org/10.1117/12.505665
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

This paper outlines an in-depth study of the W/Si coated mirrors for the High Energy Focusing Telescope (HEFT). We present data taken at 8, 40 and 60 keV obtained at the Danish Space Research Institute and the European Synchrotron Radiation Facility in Grenoble. The set of samples were chosen to cover the parameter space of sample type, sample size and coating type. The investigation includes a study of the interfacial roughness across the sample surface, as substrates and later as coated, and an analysis of the roughness correlation in the W/Si coatings for N = 10 deposited bilayers. The powerlaw graded flight coating for the HEFT mirrors is studied for uniformity and scatter, as well as its performance at high energies.

Citation Download Citation

Kristin K. Madsen, Finn E. Christensen, Carsten P. Jensen, Eric Ziegler, William W. Craig, Kurt S. Gunderson, Jason E. Koglin, and K. Pedersen "X-ray study of W/Si multilayers for the HEFT hard x-ray telescope", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); https://doi.org/10.1117/12.505665

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