Paper
17 June 2003 High-speed optical outer-diameter gauge for digital wire manufacture on-line measurement with laser and CCD technology
Hong Zhao, Xuan Wang, Rui Wang
Author Affiliations +
Proceedings Volume 5129, Fundamental Problems of Optoelectronics and Microelectronics; (2003) https://doi.org/10.1117/12.501671
Event: Fundamental Problems of Optoelectronics and Microelectronics, 2002, Vladivostok, Russian Federation
Abstract
In this paper, development of a novel optical diameter gauge is described. In order to eliminate the influence of wire vibration in the high moving speed, the semiconductor laser diode with 1.2μs exposure time aperture were used to be the illuminating light soruces, a CCD-lien sensors wtih 5000 elements and 7μm*7μm element area were applied to guage the diameter of the object. Data acquistion unit consists of high speed A/D converter, single chip processor, DMA and SRAM to process the signal data digitally in order to gain the high accuracy. The instrument obtained 0.7μm on line dynamic accuracy finally.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hong Zhao, Xuan Wang, and Rui Wang "High-speed optical outer-diameter gauge for digital wire manufacture on-line measurement with laser and CCD technology", Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); https://doi.org/10.1117/12.501671
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Cited by 2 scholarly publications.
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KEYWORDS
Charge-coupled devices

Signal processing

Optics manufacturing

Laser applications

Clocks

Data conversion

Data processing

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