Optical-electronic moments feature-based recognition system controlled by parameters of the input images

Veacheslav L. Perju; David P. Casasent; Veacheslav V. Perju; Serghei N. Zavrotscki

doi:10.1117/12.501412

6 August 2003 Optical-electronic moments feature-based recognition system controlled by parameters of the input images

Veacheslav L. Perju, David P. Casasent, Veacheslav V. Perju, Serghei N. Zavrotscki

Proceedings Volume 5106, Optical Pattern Recognition XIV; (2003) https://doi.org/10.1117/12.501412
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

The new methods of invariant pattern recognition (IPR), based on the effective calculation of image moment features are presented. It is described the special purpose multiprocessor computer system, which realizes the proposed methods of IPR. The system is reconfigurable, with the architecture controlled by parameters of the input images.

Citation Download Citation

Veacheslav L. Perju, David P. Casasent, Veacheslav V. Perju, and Serghei N. Zavrotscki "Optical-electronic moments feature-based recognition system controlled by parameters of the input images", Proc. SPIE 5106, Optical Pattern Recognition XIV, (6 August 2003); https://doi.org/10.1117/12.501412

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