Characterization and modeling of the infrared properties of GaP and GaAs

Michael E. Thomas; David W. Blodgett; Daniel V. Hahn; Simon G. Kaplan

doi:10.1117/12.487878

26 September 2003 Characterization and modeling of the infrared properties of GaP and GaAs

Michael E. Thomas, David W. Blodgett, Daniel V. Hahn, Simon G. Kaplan

Proceedings Volume 5078, Window and Dome Technologies VIII; (2003) https://doi.org/10.1117/12.487878
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

The experimental characterization of multiphonon absorption in polycrystalline GaP and GaAs as a function of temperature and frequency is presented. Becaues GaP and GaAs have moderate bandgaps, free carrier absorption is examined at high temperature as well. The longwave transparency and excellent thermal and mechanical properties of GaP make it a candidate for future high-stress environment applications. In this paper, a broadband FTIR transmissometer is used with a frequency range from 500 to 5000 cm^-1 for GaP and 400 to 5000 cm^-1 for GaAs. Spectral measurements were performed from 10 to 800 K for GaP and 10 to 295 K for GaAs. In addition, high temperature laser transmittance measurements using HeNe lasers (632.8 nm and 3.39 μm) and a CO₂ (10.6 μm) laser were conducted up to 1100 K. Using this experimental data set, an updated multiphonon and free carrier absorption model is developed that represents the experimental data over all temperatures and frequencies.

Citation Download Citation

Michael E. Thomas, David W. Blodgett, Daniel V. Hahn, and Simon G. Kaplan "Characterization and modeling of the infrared properties of GaP and GaAs", Proc. SPIE 5078, Window and Dome Technologies VIII, (26 September 2003); https://doi.org/10.1117/12.487878

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