Novel Method For The Analysis Of Printed Circuit Images

Jon R. Mandeville

doi:10.1117/12.944849

4 December 1984 Novel Method For The Analysis Of Printed Circuit Images

Jon R. Mandeville

Proceedings Volume 0504, Applications of Digital Image Processing VII; (1984) https://doi.org/10.1117/12.944849
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

To keep pace with the trend towards increased circuit integration, printed circuit patterns are becoming denser and more complex. A variety of automated visual inspection methods to detect circuit defects during manufacturing have been proposed. This paper describes a method that is a synthesis of the reference-comparison and the generic property approaches that exploits their respective strengths and over-comes their respective weaknesses. It is based on the observation that the local geometric and global topological correctness of a printed circuit can be inferred from the correctness of simplified, skeletal versions of the circuit in a test image. These operations can be realized using simple processing elements which are well suited for implementation in hardware.

Citation Download Citation

Jon R. Mandeville "Novel Method For The Analysis Of Printed Circuit Images", Proc. SPIE 0504, Applications of Digital Image Processing VII, (4 December 1984); https://doi.org/10.1117/12.944849

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