Paper
30 April 2003 Requirements and strategy for reliability tests of MEMS-based technologies in optical networks
Hans-Juergen Schmidtke
Author Affiliations +
Abstract
The technology of tomorrow's telecommunication networks will be flexible, scalable and integrated. In addition, there is a visible trend towards purely optical networking to avoid costly electronic regeneration. The move towards optical networking drives the development of new optical components to exceed current technical and physical boundaries. These new optical components include Photonic Optical Cross-connects (PXC) and Tuneable Lasers (TL), which can be realized by Micro Electro-Mechanical Systems (MEMS) based technology. MEMS technology allows the integration of optical switches with very high density. At the same time introducing MEMS technology is a step back from having no moving parts to mechanics. The trade-off between the risks and the advantages must be addressed. Typical optical requirements for the function of MEMS based technologies are introduced, and a strategy to prove the reliability is shown.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hans-Juergen Schmidtke "Requirements and strategy for reliability tests of MEMS-based technologies in optical networks", Proc. SPIE 4940, Reliability of Optical Fiber Components, Devices, Systems, and Networks, (30 April 2003); https://doi.org/10.1117/12.477398
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microelectromechanical systems

Switches

Networks

Optical networks

Reliability

Optical components

Optical switching

RELATED CONTENT

Latest key technology for NGN
Proceedings of SPIE (November 19 2007)
Comparative performance assessment of switching options
Proceedings of SPIE (November 16 2004)
Reconfigurable optical add drop multiplexers (R OADMs) a key...
Proceedings of SPIE (September 03 2002)
Photonic MEMS switch applications
Proceedings of SPIE (July 30 2001)

Back to Top