Reflecting optical system to increase signal intensity in confocal microscopy

Dong Kyun Kang; Jungwoo Seo; Dae gab Gweon

doi:10.1117/12.464066

20 September 2002 Reflecting optical system to increase signal intensity in confocal microscopy

Dong Kyun Kang, Jungwoo Seo, Dae gab Gweon

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Proceedings Volume 4927, Optical Design and Testing; (2002) https://doi.org/10.1117/12.464066
Event: Photonics Asia, 2002, Shanghai, China

Abstract

In fluorescence mode confocal microscopes, only 0.02% of emitted signal can be detected in best case. So, we proposed reflecting optical system to increase signal intensity detected in photon detector. In this paper, we evaluate the proposed reflecting optical system using optical transfer function. To evaluate the proposed system, we used the modeling method based on wave optics. We first calculated point spread function of total system, and calculated optical transfer function of total system. When we use the proposed reflecting optical system, we can increase the signal intensity detected in photon detector. Amount of increased signal intensity depends on the ratio of NA of objective in the original confocal microscopy to NA of objective in reflecting optical system. We also simulated axial response of total system. FWHM of axial response increased a little when using reflecting optical system. The amount of increased FWHM also depends on the ratio of NA, mentioned above. Maximum increase in FWHM of axial response is about 5%.

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Dong Kyun Kang, Jungwoo Seo, and Dae gab Gweon "Reflecting optical system to increase signal intensity in confocal microscopy", Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); https://doi.org/10.1117/12.464066

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KEYWORDS

Confocal microscopy

Objectives

Optical transfer functions

Signal detection

Point spread functions

Luminescence

Photodetectors

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