Paper
27 December 2002 Hybrid optical proximity correction: concepts and results
Meg Hung, Pratheep Balasingam
Author Affiliations +
Abstract
Optical Proximity Correction (OPC) is increasingly important in the design and manufacturing of integrated circuits, since many of them now contain features which are smaller than the wavelength of light used in lithography. The optical distortions that beset these subwavelength designs are counteracted through the use of OPC, which strategically applies complex corrections to the original features using either a rule-based or model-based approach. Model-based OPC (MOPC) can be very accurate but it suffers from poor speed. Rule-based OPC (ROPC), on the other hand, can convert layouts quickly but at the expense of accuracy. A new concept for optical proximity correction, Hybrid OPC (HOPC), is proposed for enabling the user to control the tradeoff between accuracy and speed of conversion at a fine-grain level of details. Based on feature context, shape, and geometric information such as widths and spacings, HOPC technique can selectively apply MOPC to the most critical regions of the design while allowing the application of ROPC elsewhere. In this paper, we will describe the approach taken as well as provide benchmark data demonstrating the effectiveness of the concept.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Meg Hung and Pratheep Balasingam "Hybrid optical proximity correction: concepts and results", Proc. SPIE 4889, 22nd Annual BACUS Symposium on Photomask Technology, (27 December 2002); https://doi.org/10.1117/12.468204
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications and 2 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical proximity correction

Model-based design

Tolerancing

Transistors

Data modeling

Optics manufacturing

Process modeling

RELATED CONTENT

Enriching design intent for optimal OPC and RET
Proceedings of SPIE (August 01 2002)
Process window and interlayer aware OPC for the 32 nm...
Proceedings of SPIE (March 27 2007)
Rules based process window OPC
Proceedings of SPIE (March 04 2008)
Model-based DRC for design and process integration
Proceedings of SPIE (November 08 2005)

Back to Top