Measurement system for photodetector characterization

Anssi Jaakko Maekynen; Sampo Backman; Juha Tapio Kostamovaara

doi:10.1117/12.464022

27 August 2003 Measurement system for photodetector characterization

Anssi Jaakko Maekynen, Sampo Backman, Juha Tapio Kostamovaara

Author Affiliations +

Proceedings Volume 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications; (2003) https://doi.org/10.1117/12.464022
Event: OPTO Ireland, 2002, Galway, Ireland

Abstract

A measurement system for electro-optical characterization of photodetectors and photodetector arrays is presented. The system is intended for laboratory use where typically a few devices are characterized at a time. The instrument is designed for determining the photoresponse (dc and pulse) of a single photodetector or a photodetector array as a function of wavelength, position, and temperature. In case of photodetector arrays, the measurement of modulation transfer function (MTF) and fast determination of its photoresponse nonuniformity (PRNU) is also possible. The instrument setup and experimental results are presented.

Citation Download Citation

Anssi Jaakko Maekynen, Sampo Backman, and Juha Tapio Kostamovaara "Measurement system for photodetector characterization", Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); https://doi.org/10.1117/12.464022

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