Paper
19 November 2003 Heterodyne scanning near-field optical microscope
Author Affiliations +
Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.529222
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
A coherent scanning near-field optical microscope (SNOM) is presented. The set-up employs heterodyne interferometry, allowing measurements of both amplitude and phase of the optical field. Experimental results show polarization effects that reveal important information about the vectorial field conversion by the fiber tip.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luciana Vaccaro, Antonello Nesci, Rene Dandliker, and Hans-Peter Herzig "Heterodyne scanning near-field optical microscope", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.529222
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Cited by 2 scholarly publications.
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KEYWORDS
Near field scanning optical microscopy

Heterodyning

Optical microscopes

Polarization

Near field optics

Phase measurement

Near field

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