Time-frequency domain reflectometry for smart wiring systems

Yong-June Shin; Eun-Seok Song; Joo-Won Kim; Jin-Bae Park; Jong-Gwan Yook; Edward J. Powers

doi:10.1117/12.451709

6 December 2002 Time-frequency domain reflectometry for smart wiring systems

Yong-June Shin, Eun-Seok Song, Joo-Won Kim, Jin-Bae Park, Jong-Gwan Yook, Edward J. Powers

Proceedings Volume 4791, Advanced Signal Processing Algorithms, Architectures, and Implementations XII; (2002) https://doi.org/10.1117/12.451709
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

In this paper, a new high resolution reflectometry scheme, time-frequency domain reflectometry, is proposed to detect and locate a fault in wiring. Traditional reflectometry methods have been achieved in either the time domain or frequency domain only. However, time-frequency domain reflectometry utilizes time and frequency information of a transient signal to detect and locate the fault. The time-frequency domain reflectometry approach described in this paper is characterized by time-frequency reference signal design and post-processing of the reference and reflected signals to detect and locate the fault. Using a computational electromagnetic model of a coaxial cable with a fault, time-frequency domain reflectometry has been demonstrated. Knowledge of time and frequency localized information for the reference and reflected signal gained via time-frequency analysis, allows one to detect the fault and estimate the location accurately.

Citation Download Citation

Yong-June Shin, Eun-Seok Song, Joo-Won Kim, Jin-Bae Park, Jong-Gwan Yook, and Edward J. Powers "Time-frequency domain reflectometry for smart wiring systems", Proc. SPIE 4791, Advanced Signal Processing Algorithms, Architectures, and Implementations XII, (6 December 2002); https://doi.org/10.1117/12.451709

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