Highly reflective uranium mirrors for astrophysics applications

David D. Allred; Matthew B. Squires; R. Steven Turley; Webster C. Cash; Ann F. Shipley

doi:10.1117/12.451359

24 December 2002 Highly Reflective Uranium Mirrors for Astrophysics Applications

David D. Allred, Matthew B. Squires, R. Steven Turley, Webster C. Cash, Ann F. Shipley

Proceedings Volume 4782, X-Ray Mirrors, Crystals, and Multilayers II; (2002) https://doi.org/10.1117/12.451359
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

The reported optical constants of uranium differ from that of vacuum significantly more than other elements do over the range of about 150 to 350 eV. This suggests that uranium could be used to produce high reflectance imaging mirrors for many soft x-ray applications. Elemental uranium is too chemically active to be used as a front surface mirror without protection. We computed the expected reflectance of carbon-coated uranium films and of uranium-nickel alloys for low-angle reflectors. Carbon is mostly transparent below its K absorption edge at about 283 eV. The reflectance at 10 degrees from grazing is computed to be greater than 50% at 277 eV (C K_α). For comparison, about 5 degrees is the maximum grazing incidence angle for which conventional materials are computed to have comparable reflectance. We sputter deposited and measured the reflectance of carbon-coated uranium layers at 44.7 Å (C K_α). Sample reflectance was a factor of two greater than that of nickel, the material used for low-angle mirrors. The initial oxidation behavior of sputtered uranium-nickel alloys is similar to pure U so their reflectance was not determined. Coatings based on uranium should be considered for all applications where high-reflectance, broadband, low-angle soft x-ray mirrors are required

Citation Download Citation

David D. Allred, Matthew B. Squires, R. Steven Turley, Webster C. Cash, and Ann F. Shipley "Highly Reflective Uranium Mirrors for Astrophysics Applications", Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); https://doi.org/10.1117/12.451359

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available