Bond's method used for a double-crystal spectrometer equipped with a polycapillary halflens

Ernst K. Kov'ev; Artem P. Malakho; Sergey N. Polyakov

doi:10.1117/12.489739

30 July 2002 Bond's method used for a double-crystal spectrometer equipped with a polycapillary halflens

Ernst K. Kov'ev, Artem P. Malakho, Sergey N. Polyakov

Proceedings Volume 4765, International Conference on X-ray and Neutron Capillary Optics; (2002) https://doi.org/10.1117/12.489739
Event: International Conference on X-ray and Neutron Capillary Optics, 2001, Zvenigorod, Russian Federation

Abstract

A new version of diffraction method for measuring the absolute values of intra-plane distances d_hkl in crystals and epixtaxial films using Kumakhov's x-ray poly-capillary half-lenses was developed. An attachment attachment to general-purpose x-ray diffractometer MRD was develoepd to register diffractograms within the angle range between 0 ÷ 160° with error of Δ_hkl/d approximately 10^-5. A method of precision d_hkl measurement was verified using perfect quartz crystals.

Citation Download Citation

Ernst K. Kov'ev, Artem P. Malakho, and Sergey N. Polyakov "Bond's method used for a double-crystal spectrometer equipped with a polycapillary halflens", Proc. SPIE 4765, International Conference on X-ray and Neutron Capillary Optics, (30 July 2002); https://doi.org/10.1117/12.489739

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