Paper
1 April 2002 Highly sensitive polarimetry
V. A. Ruilova-Zavgorodniy, N. V. Chigarev, Dmitri Yu. Paraschuk
Author Affiliations +
Abstract
We present a highly sensitive method of pump-probe polarimetry for measurements of small pump-induced polarization rotation and ellipticity. The sensitivity of the method is analyzed for technical and shot-noise probe power fluctuations. The optimal polarimeter configuration is found. We show that it is possible to enhance the sensitivity to the pump-induced ellipticity by setting a small probe ellipticity inside the polarimeter with the help of a small shift wave plate. We applied the method in cw and ps measurements of photoinduced polarization parameters in a nanopolyacetylene film. The typical measured angles of polarization rotation were approximately 10-5 and approximately 10-8 rad in the cw and ps experiments, respectively.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. A. Ruilova-Zavgorodniy, N. V. Chigarev, and Dmitri Yu. Paraschuk "Highly sensitive polarimetry", Proc. SPIE 4750, ICONO 2001: Quantum and Atomic Optics, High-Precision Measurements in Optics, and Optical Information Processing, Transmission, and Storage, (1 April 2002); https://doi.org/10.1117/12.464465
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Polarimetry

Polarization

Wave plates

Picosecond phenomena

Absorption

Dichroic materials

Optical testing

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